Wyniki wyszukiwania dla: J.A. del Alamo
Journal of Crystal Growth > 2018 > 484 > C > 86-91
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 297 - 304
Microelectronics Reliability > 2009 > 49 > 9-11 > 1200-1206
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 2895 - 2901
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 283 - 288
IEEE Electron Device Letters > 2008 > 29 > 4 > 287 - 289
Proceedings of the IEEE > 2008 > 96 > 6 > 931 - 950
IEEE Electron Device Letters > 2008 > 29 > 8 > 830 - 833
IEEE Electron Device Letters > 2008 > 29 > 7 > 665 - 667
IEEE Transactions on Electron Devices > 2008 > 55 > 10 > 2546 - 2553