Search results for: Jungwoo Joh
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3132 - 3138
2016 IEEE International Electron Devices Meeting (IEDM) > 20.5.1 - 20.5.4
2014 IEEE International Reliability Physics Symposium > 6C.5.1 - 6C.5.4
2014 IEEE International Reliability Physics Symposium > 2A.4.1 - 2A.4.4
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2667 - 2674
Microelectronics Reliability > 2012 > 52 > 1 > 33-38
physica status solidi (a) > 208 > 7 > 1611 - 1613
2011 International Reliability Physics Symposium > 4E.3.1 - 4E.3.4
Microelectronics Reliability > 2011 > 51 > 2 > 201-206
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 132 - 140
2010 International Electron Devices Meeting > 20.2.1 - 20.2.4
Microelectronics Reliability > 2010 > 50 > 6 > 758-762
Microelectronics Reliability > 2010 > 50 > 6 > 767-773
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 2895 - 2901
IEEE Electron Device Letters > 2008 > 29 > 4 > 287 - 289
IEEE Electron Device Letters > 2008 > 29 > 10 > 1098 - 1100