Search results for: Ming-Dou Ker
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.2.1 - EL.2.6
Microelectronics Reliability > 2013 > 53 > 2 > 208-214
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3625 - 3631
IEEE Transactions on Circuits and Systems I: Regular Papers > 2013 > 60 > 10 > 2549 - 2560
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3500 - 3507
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1011 - 1018
IEEE Electron Device Letters > 2013 > 34 > 5 > 674 - 676
IEEE Transactions on Biomedical Circuits and Systems > 2013 > 7 > 2 > 196 - 203
IEEE Transactions on Microwave Theory and Techniques > 2013 > 61 > 2 > 914 - 921
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 110 - 118