Search results for: Ming-Dou Ker
Microelectronics Reliability > 2017 > 78 > C > 258-266
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3979 - 3985
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 5 > 1087 - 1096
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 570 - 576
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3519 - 3523
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2812 - 2819
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 3 > 528 - 536
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 642 - 645
IEEE Transactions on Biomedical Circuits and Systems > 2016 > 10 > 6 > 1087 - 1099
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 549 - 555
IEEE Electron Device Letters > 2016 > 37 > 11 > 1387 - 1390
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3177 - 3184