Search results for: H.J. Mattausch
Microelectronics Reliability > 2018 > 80 > C > 164-175
IEEE Electron Device Letters > 2009 > 30 > 8 > 873 - 875
Mathematics and Computers in Simulation > 2008 > 79 > 4 > 1096-1106
2008 IEEE Power Electronics Specialists Conference > 998 - 1003
Solid State Sciences > 2008 > 10 > 4 > 401-407