Search results for: S. Kubicek
2016 IEEE International Electron Devices Meeting (IEDM) > 17.5.1 - 17.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 19.7.1 - 19.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1084 - 1087
Thin Solid Films > 2016 > 602 > C > 72-77
2015 IEEE International Electron Devices Meeting (IEDM) > 21.8.1 - 21.8.4
2015 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
2015 IEEE International Electron Devices Meeting (IEDM) > 14.1.1 - 14.1.4
Microelectronic Engineering > 2013 > 112 > Complete > 92-96
2012 International Electron Devices Meeting > 18.4.1 - 18.4.4
2012 International Electron Devices Meeting > 25.3.1 - 25.3.4