Search results for: Juin J. Liou
Microelectronics Reliability > 2017 > 79 > C > 201-205
Microelectronics Reliability > 2017 > 78 > C > 307-310
Solid-State Electronics > 2017 > 137 > C > 38-43
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2221 - 2227
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-4.1 - EL-4.4
Microelectronics Reliability > 2017 > 69 > C > 1-16
IEEE Electron Device Letters > 2016 > 37 > 11 > 1477 - 1480
Microelectronics Reliability > 2016 > 66 > C > 46-51
IEEE Electron Device Letters > 2016 > 37 > 10 > 1311 - 1313
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
Microelectronics Reliability > 2016 > 61 > C > 106-110
Solid-State Electronics > 2016 > 115 > PA > 54-59