Search results for: N. Aymerich
Radiation Physics and Chemistry > 2015 > 116 > Complete > 365-367
Microelectronics Journal > 2014 > 45 > 10 > 1342-1347
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 344 - 350
IEEE Transactions on Nanotechnology > 2014 > 13 > 5 > 926 - 932
Microelectronics Journal > 2013 > 44 > 9 > 787-793