Search results for: Wen Liu
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 799 - 801
IEEE Electron Device Letters > 2017 > 38 > 7 > 835 - 838
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 475 - 478
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2975 - 2979
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-3-1 - 7A-3-5
IEEE Electron Device Letters > 2016 > 37 > 4 > 359 - 362
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3639 - 3644
IEEE Transactions on Power Electronics > 2013 > 28 > 10 > 4742 - 4752
IEEE Electron Device Letters > 2011 > 32 > 3 > 330 - 332
IEEE Electron Device Letters > 2011 > 32 > 9 > 1239 - 1241
IEEE Electron Device Letters > 2011 > 32 > 7 > 967 - 969
IEEE Electron Device Letters > 2010 > 31 > 9 > 915 - 917