Search results for: Clément Fleury
Microelectronics Reliability > 2015 > 55 > 9-10 > 1687-1691
Microelectronics Reliability > 2015 > 55 > 9-10 > 1471-1475
IEEE Transactions on Electron Devices > 2014 > 61 > 10 > 3429 - 3434
Microelectronics Reliability > 2013 > 53 > 9-11 > 1444-1449
Geophysical Prospecting > 61 > 5 > 891 - 906
Geophysical Journal International > 183 > 3 > 1648 - 1662