Wyniki wyszukiwania dla: Y. Li
2015 IEEE International Electron Devices Meeting (IEDM) > 13.3.1 - 13.3.4
IEEE Electron Device Letters > 2011 > 32 > 5 > 674 - 676
2007 IEEE Nuclear Science Symposium Conference Record > 2 > 1463 - 1470
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. > S. Cohen - L. Deligianni