Search results for: A. Rueda
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2966 - 2970
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 2 > 452 - 461
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2966 - 2970
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 2 > 452 - 461