Search results for: W. Claeys
International Dairy Journal > 2014 > 39 > 1 > 121-130
IEEE Electron Device Letters > 2009 > 30 > 3 > 222 - 224
Superlattices and Microstructures > 2007 > 41 > 1 > 7-16
Microelectronics Reliability > 2006 > 46 > 9-11 > 1520-1524
Proceedings of the IEEE > 2006 > 94 > 8 > 1519 - 1533
Microelectronics Reliability > 2005 > 45 > 9-11 > 1482-1486
Superlattices and Microstructures > 2005 > 38 > 1 > 69-75
Journal of Dairy Science > 2005 > 88 > 5 > 1646-1653
Microelectronics Reliability > 2004 > 44 > 1 > 95-103
Microelectronics Reliability > 2000 > 40 > 8-10 > 1509-1514
Microelectronics Journal > 1999 > 30 > 11 > 1125-1128
Microelectronics Reliability > 1999 > 39 > 6-7 > 919-923
Microelectronics Reliability > 1999 > 39 > 6-7 > 981-985
Journal of Electronic Testing > 1999 > 14 > 1-2 > 57-66
Microelectronics Reliability > 1998 > 38 > 10 > 1591-1597