Search results for: S. Grauby
IEEE Photonics Technology Letters > 2016 > 28 > 6 > 665 - 668
Microelectronics Reliability > 2015 > 55 > 9-10 > 1746-1749
IEEE Electron Device Letters > 2009 > 30 > 3 > 222 - 224
Superlattices and Microstructures > 2007 > 41 > 1 > 7-16
Microelectronics Reliability > 2006 > 46 > 9-11 > 1520-1524
Microelectronics Reliability > 2005 > 45 > 9-11 > 1482-1486
Superlattices and Microstructures > 2005 > 38 > 1 > 69-75
Microelectronics Reliability > 2004 > 44 > 1 > 95-103