Search results for: Hyungsoon Shin
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3914 - 3921
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 873 - 876
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 666 - 672
Solid State Electronics > 2014 > 94 > Complete > 23-27
IEEE Electron Device Letters > 2014 > 35 > 2 > 193 - 195
Electronics Letters > 2014 > 50 > 15 > 1093 - 1095
Solid State Electronics > 2010 > 54 > 4 > 497-503
IEEE Transactions on Electron Devices > 2008 > 55 > 3 > 890 - 895
IEEE Transactions on Magnetics > 2007 > 43 > 6 > 2677 - 2679
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 2040 - 2044
Solid State Electronics > 2004 > 48 > 7 > 1163-1168
Current Applied Physics > 2004 > 4 > 1 > 19-24
Solid State Electronics > 2001 > 45 > 7 > 1165-1172
Microelectronics Reliability > 2000 > 40 > 12 > 2019-2022