Search results for: Sang-Goo Jung
Microelectronics Reliability > 2012 > 52 > 4 > 662-669
Microelectronic Engineering > 2009 > 86 > 10 > 2045-2048
IEEE Transactions on Electron Devices > 2008 > 55 > 4 > 1020 - 1026
Microelectronics Reliability > 2012 > 52 > 4 > 662-669
Microelectronic Engineering > 2009 > 86 > 10 > 2045-2048
IEEE Transactions on Electron Devices > 2008 > 55 > 4 > 1020 - 1026