Search results for: C. de Santi
Microelectronics Reliability > 2018 > 80 > C > 257-265
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3734 - 3739
Microelectronics Reliability > 2017 > 76-77 > C > 556-560
Microelectronics Reliability > 2017 > 76-77 > C > 584-587
Microelectronics Reliability > 2017 > 76-77 > C > 575-578
Microelectronics Reliability > 2016 > 64 > C > 623-626
Microelectronics Reliability > 2016 > 64 > C > 610-613
Microelectronics Reliability > 2015 > 55 > 9-10 > 1754-1758
Microelectronics Reliability > 2015 > 55 > 9-10 > 1775-1778
Microelectronics Reliability > 2015 > 55 > 9-10 > 1765-1769
physica status solidi (a) > 212 > 5 > 974 - 979
Microelectronics Reliability > 2014 > 54 > 9-10 > 2138-2141
Microelectronics Reliability > 2014 > 54 > 9-10 > 2147-2150
Microelectronic Engineering > 2013 > 109 > Complete > 257-261