Search results for: Chang-Lin Yeh
Microelectronics Reliability > 2011 > 51 > 1 > 179-186
IEEE Transactions on Electronics Packaging Manufacturing > 2010 > 33 > 2 > 84 - 90
2008 10th Electronics Packaging Technology Conference > 1486 - 1490
Microelectronics Reliability > 2008 > 48 > 11-12 > 1837-1846
Microelectronics Reliability > 2008 > 48 > 5 > 757-762
Journal of Alloys and Compounds > 2008 > 450 > 1-2 > 238-244
Microelectronics Reliability > 2008 > 48 > 2 > 282-292
Microelectronics Reliability > 2008 > 48 > 2 > 274-281