Search results for: X. Zhang
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 170 - 175
IEEE Electron Device Letters > 2016 > 37 > 9 > 1193 - 1196
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4470 - 4475
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4483 - 4487
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4498 - 4504
IEEE Transactions on Nuclear Science > 2013 > 60 > 1-2 > 402 - 407
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2674 - 2681
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2966 - 2973
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 3062 - 3068
2011 International Reliability Physics Symposium > SE.4.1 - SE.4.4