Search results for: Du
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 121 - 129
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1053 - 1059
2016 IEEE International Electron Devices Meeting (IEDM) > 5.5.1 - 5.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 384 - 387
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 196 - 197