Search results for: Chao Chen
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-7.1 - PM-7.4
2010 International Electron Devices Meeting > 5.5.1 - 5.5.4
Proceedings of the IEEE > 2010 > 98 > 7 > 1197 - 1207
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 416 - 425