Search results for: Wen-Kuan Yeh
Analog Integrated Circuits and Signal Processing > 2018 > 96 > 3 > 409-416
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2314 - 2320
Nanoscale Research Letters > 2017 > 12 > 1 > 1-6
Surface and Coatings Technology > 2016 > 308 > C > 101-107
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
2016 IEEE International Electron Devices Meeting (IEDM) > 9.1.1 - 9.1.4
2016 IEEE International Electron Devices Meeting (IEDM) > 2.3.1 - 2.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 14.3.1 - 14.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 16.1.1 - 16.1.4
Microelectronics Reliability > 2016 > 67 > C > 89-93
IEEE Electron Device Letters > 2016 > 37 > 11 > 1379 - 1382
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 286 - 293
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 190 - 191
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 130 - 131