Search results for: F. Li
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.2.1 - MY.2.5
IEEE Electron Device Letters > 2012 > 33 > 4 > 585 - 587
IEEE Electron Device Letters > 2011 > 32 > 3 > 396 - 398
IEEE Electron Device Letters > 2008 > 29 > 1 > 50 - 53
IEEE Electron Device Letters > 2007 > 28 > 4 > 292 - 294