Search results for: H. Lee
2015 IEEE International Electron Devices Meeting (IEDM) > 22.5.1 - 22.5.4
Journal of Raman Spectroscopy > 46 > 6 > 524 - 530
IEEE Electron Device Letters > 2015 > 36 > 3 > 259 - 261
Archives of Metallurgy and Materials > 2015 > Vol. 60, iss. 2B > 1491--1497
2013 IEEE International Electron Devices Meeting > 4.5.1 - 4.5.4
2013 IEEE International Electron Devices Meeting > 20.4.1 - 20.4.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 3E.1.1 - 3E.1.5
2012 International Electron Devices Meeting > 23.5.1 - 23.5.4
2012 International Electron Devices Meeting > 6.5.1 - 6.5.4