Search results for: F. Ito
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1579 - 1587
IEEE Transactions on Semiconductor Manufacturing > 2008 > 21 > 3 > 469 - 480
2007 IEEE International Electron Devices Meeting > 973 - 976
2007 IEEE International Electron Devices Meeting > 445 - 448
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 1867 - 1877
IEEE Transactions on Semiconductor Manufacturing > 2006 > 19 > 4 > 455 - 464