Search results for: G. Hughes
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294
2010 Developments in E-systems Engineering > 175 - 181
IEEE Security & Privacy > 2008 > 6 > 3 > 57 - 59
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294
2010 Developments in E-systems Engineering > 175 - 181
IEEE Security & Privacy > 2008 > 6 > 3 > 57 - 59