Wyniki wyszukiwania dla: H. Ohno
Microelectronics Reliability > 2012 > 52 > 4 > 613-627
IEEE Magnetics Letters > 2012 > 3 > 300204
2011 International Electron Devices Meeting > 4.3.1 - 4.3.4
Scandinavian Journal of Medicine & Science in Sports > 21 > 6 > e115 - e121
Solid State Electronics > 2011 > 58 > 1 > 28-33
IEEE Transactions on Magnetics > 2011 > 47 > 6-1 > 1567 - 1570
2010 International Electron Devices Meeting > 9.4.1 - 9.4.4