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We propose and experimentally validate an AFD (atomic flux divergence)-based MTTF (mean time to failure) model for wires with EM. We analyze traditional MTTF models and compare them to the proposed model. We use the AFD-based compensation model to quantitatively capture the reservoir effect and provide a relationship between the reservoir's volume and EM lifetime enhancement.
In this paper, the atomic flux divergence (AFD) based flow for AC and pulsed DC signal line electromigration (EM) reliability estimation is proposed. The flow is implemented as a 3-stage filter based on the average (AVG) and root-mean-square (RMS) current densities. A relationship between AVG and/or RMS current densities, maximum AFD, and EM lifetime is established and validated. To avoid the necessity...
In this paper, we propose a current waveform estimation algorithm for signal lines without the necessity of SPICE simulation. Unlike previous methods, we do not use function fitting or compute the effective capacitance. Instead, the proposed algorithm predicts the current waveform by using current responses of a driver for multiple fixed capacitances provided by the foundry. We demonstrate usefulness...
In this paper, we develop an AC electromigration (EM) model for signal lines manufactured with copper dual damascene process. For the first time, the healing factor of AC EM is quantitatively modeled. To measure EM reliability of interconnects considering timing margins we introduce AC EM functional lifetime. We also develop an atomic flux divergence (AFD)-based void growth model to explain the resistance...
Electromigration (EM) greatly affects the long-term reliability of VLSI chips. Not only power/ground lines but also bitlines of SRAM arrays may be damaged by EM. In this paper, we analyze current flow on SRAM bitline, demonstrate that it may suffer EM due to the pulsed dc pattern, and conclude that bitline’s EM reliability can dramatically be worsened by process variation due to a significant increase...
In this paper, we study electromigration (EM) reliability of signal lines. We propose a general model for current conversion from pulsed DC to steady DC based on the consistency of maximal atomic flux divergence. Both long and short lead lines with high frequency current are considered. The calculated effective steady DC agrees with the measured results. Our conversion scheme can be applied also to...
Electromigration (EM) greatly affects the long term reliability of VLSI chips. Not only power/ground (P/G) lines, but also bit-lines of SRAM arrays may be damaged by EM. In this work, we demonstrate that the EM reliability of an SRAM array can be dramatically worsened by process variation due to a significant increase of sub-threshold leakage current on the bit-line. We statistically model the effects...
In this paper, we demonstrate that signal lines in SRAM arrays are prone to electromigration (EM). Our analysis shows that the read operation can cause unidirectional current flow in bit-lines. Thus the length of bit-lines should be bounded not only by performance requirements, but also by the Blech length constraint to avoid EM. We propose a method of determining the bit-line width under layout constraints...
A design of a SHA merged with MDAC(SMDAC) which can be used in a 14 bit 80Msps pipelined analog-to-digital converter (ADC) is presented in this paper. A two-stage transconductance-controlled op-amp is used in the SMDAC to ensure the requirment of the resolution, speed and stability of the circuit when its feedback factor alternate between 1/2 and 1/4. Simulation by cadence based on Chartered 0.18µ...
A design of opamp-sharing multiplying digital-to-analog converter (MDAC) used in the successive stages of an 80MS/s 14-bit pipelined analog-to-digital converter (ADC) with 1.8V supply voltage is presented in this paper. Opamp-sharing structure of the paper is proposed to achieve low-power operation, and SC-CMFB (switch capacitor-common mode feedback) circuit further reduces power consumption. The...
Based on Chartered 0.18μ 1.8V 1P5M CMOS process, a gain-boosted telescopic fully differential amplifier with CMFB circuit is designed and used in the sampling and holding circuit of a 14-bit, pipelined A/D converter which is supplied by 1.8 V power. In order to meet specifications, gain-boosting technique is used to improve the gain of OTA and common-mode feedback circuit is elaborately designed....
This paper presents a novel and simple pixel-level image authentication scheme to detect the tampered pixels, which utilizes the extreme sensitivity of Hash function in order to achieve precise tamper localization. Block numbers and image unique index are used to extract watermarks and locate tampered position. Moreover, the property of blocks correlation makes it can effectively resist VQ attack...
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