Search results for: Yu Lin
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3979 - 3985
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-1-1 - EL-1-4
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2015 > 37 > 12 > 2388 - 2401
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2824 - 2829
IEEE Transactions on Industrial Electronics > 2015 > 62 > 5 > 2921 - 2929