Search results for: H. Kim
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
IEEE Journal of Solid-State Circuits > 2017 > 52 > 6 > 1655 - 1663
2015 IEEE International Reliability Physics Symposium > 6A.3.1 - 6A.3.5
IEEE Spectrum > 2011 > 48 > 5 > 28 - 33
2010 International Electron Devices Meeting > 4.2.1 - 4.2.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 947 - 956