Search results for: H. Kim
Electronics Letters > 2017 > 53 > 14 > 910 - 912
IEEE Design & Test of Computers > 2011 > 28 > 1 > 6 - 8
IEEE Journal of Solid-State Circuits > 2011 > 46 > 6 > 1495 - 1505
2010 International Electron Devices Meeting > 12.6.1 - 12.6.4