Search results for: Y. Li
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 3A-2-1 - 3A-2-6
IEEE Electron Device Letters > 2016 > 37 > 2 > 220 - 223
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.3.1 - 2F.3.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.4.1 - 2F.4.8
IEEE Electron Device Letters > 2011 > 32 > 5 > 668 - 670