Search results for: H. Lin
IEEE Electron Device Letters > 2013 > 34 > 2 > 163 - 165
IEEE Journal of Solid-State Circuits > 2008 > 43 > 8 > 1826 - 1834
IEEE Electron Device Letters > 2013 > 34 > 2 > 163 - 165
IEEE Journal of Solid-State Circuits > 2008 > 43 > 8 > 1826 - 1834