Search results for: A Lauwers
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Processed Silicon and Other Device Materials > 379-388
Microelectronic Engineering > 2011 > 88 > 5 > 578-582
Solid State Electronics > 2010 > 54 > 9 > 855-860
Microelectronic Engineering > 2010 > 87 > 3 > 306-310
Materials Science & Engineering B > 2008 > 154-155 > Complete > 144-154
Solid State Electronics > 2008 > 52 > 9 > 1303-1311
IEEE Transactions on Electron Devices > 2008 > 55 > 5 > 1259 - 1264
IEEE Electron Device Letters > 2008 > 29 > 4 > 378 - 381
IEEE Electron Device Letters > 2008 > 29 > 1 > 34 - 37
IEEE Transactions on Electron Devices > 2008 > 55 > 5 > 1170 - 1176