Search results for: P. Scheiblin
2016 IEEE International Electron Devices Meeting (IEDM) > 32.6.1 - 32.6.4
2014 IEEE International Electron Devices Meeting > 22.4.1 - 22.4.4
2012 International Electron Devices Meeting > 3.6.1 - 3.6.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 3B.2.1 - 3B.2.5
2011 International Electron Devices Meeting > 16.5.1 - 16.5.4
2007 IEEE International Electron Devices Meeting > 943 - 946
2007 IEEE International Electron Devices Meeting > 453 - 456