Search results for: P. Scheiblin
2016 IEEE International Electron Devices Meeting (IEDM) > 32.6.1 - 32.6.4
2014 IEEE International Electron Devices Meeting > 22.4.1 - 22.4.4
2012 International Electron Devices Meeting > 3.6.1 - 3.6.4
Solid State Electronics > 2012 > 76 > Complete > 36-39
2012 IEEE International Reliability Physics Symposium (IRPS) > 3B.2.1 - 3B.2.5
2011 International Electron Devices Meeting > 16.5.1 - 16.5.4
Solid State Electronics > 2011 > 65-66 > Complete > 9-15
Microelectronic Engineering > 2011 > 88 > 4 > 458-461
Solid State Electronics > 2011 > 57 > 1 > 67-72
Thin Solid Films > 2010 > 518 > 9 > 2307-2313
Thin Solid Films > 2010 > 518 > 9 > 2323-2325