Search results for: Jie Hu
IEEE Electron Device Letters > 2017 > 38 > 3 > 371 - 374
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3451 - 3458
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3479 - 3486
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-5-1 - 4A-5-6
IEEE Electron Device Letters > 2016 > 37 > 3 > 310 - 313
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 997 - 1004
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730