Search results for: Timothy J. Maloney
2016 IEEE International Reliability Physics Symposium (IRPS) > 6A-4-1 - 6A-4-6
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 792 - 800
Microelectronics Reliability > 2013 > 53 > 2 > 184-189
IEEE Electromagnetic Compatibility Magazine > 2013 > 2 > 3 > 37 - 46
EOS/ESD Symposium Proceedings > 1 - 9
Journal of Electrostatics > 2004 > 62 > 2-3 > 85-97
Microelectronics Reliability > 2003 > 43 > 7 > 987-991
Microelectronics Reliability > 2001 > 41 > 3 > 359-366
Journal of Electrostatics > 1996 > 38 > 1-2 > 113-129
IEEE Transactions on Industrial Electronics and Control Instrumentation > 1976 > IECI-23 > 1 > 44 - 46