Search results for: Roman Boschke
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-3.1 - 3F-3.6
2016 IEEE International Reliability Physics Symposium (IRPS) > 3B-5-1 - 3B-5-7
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1819 - 1825
2014 IEEE International Reliability Physics Symposium > 2E.5.1 - 2E.5.5
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 781 - 783
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4199 - 4205