Search results for: Yuan Taur
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4856 - 4860
IEEE Transactions on Nanotechnology > 2017 > 16 > 6 > 1062 - 1066
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3511 - 3514
Solid-State Electronics > 2017 > 134 > C > 1-8
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3342 - 3345
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2550 - 2555
Solid-State Electronics > 2016 > 118 > C > 18-25
Compact Modeling > Modeling of Multiple Gate MOSFETs > 431-449
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 841 - 847
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 869 - 872
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 877 - 880
IEEE Electron Device Letters > 2015 > 36 > 10 > 1094 - 1096
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 3019 - 3024
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1399 - 1404
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 813 - 820
Microelectronics Reliability > 2014 > 54 > 4 > 746-754