Search results for: Feng Lin
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 780 - 784
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3275 - 3281
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 450 - 457
IEEE Journal of Solid-State Circuits > 2008 > 43 > 3 > 631 - 641