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There are increasing interest in high temperature endurable sensor or device packaging solution for a set of wide ranging applications that include oil and gas production or deep sea exploration, advanced automotive application, aerospace, more electric aircraft initiative (MEA) or engine health management (EHM) systems, geothermal energy harvesting as well as other renewable energy industries. Besides...
TSV-Free Interposer (TFI) technology eliminates TSV fabrication and reduces manufacturing and material cost. Co-design modelling methodology is established for TFI technology with considering wafer process, package assembly and package/board level reliability and thermal performance to optimize structure design, wafer process, assembly process and material selection. Experimental results are used...
Fan-out wafer level packaging (FO-WLP) technology has lots of advantages of small form factor, higher I/O density, cost effective and high performance. However, wafer warpage is one big challenge during wafer process, which needs to be addressed for successful process integration. In this study, methodology to understand and reduce wafer warpage at different processes is presented in terms of geometry...
Three-dimensional integrated circuit (3DIC) technologies are receiving attention due to several advantages such as multi-function, low form factor and high performance microchip. Through-silicon via (TSV) approach is essential for 3DIC packaging technology. TSV fabrication process, however, is still facing several challenges. One of the widely-known challenges is via protrusion. Annealing a silicon...
Consumers' demands have driven the industry toward devices and packages with low cost, high performance, and multiple functions. Stacking two or more chips into one package becomes a popular choice. In this paper, the development of a three-die stack fine pitch ball grid array package is reported. A 65 nm Cu/low-k die is used as the bottom die in the package to increase the speed of the chip with...
Through-silicon-via (TSV) technology permits devices to be placed and wired in the third dimension. Currently, there is a strong motivation for the semiconductor industry to move to 3-D integration using the TSV approach due to many advantages of TSV application. However, there are also some challenges for stacked die package with TSVs. One of the challenges is thermo-mechanical reliability of multi-layer...
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