Search results for: Gino Giusi
Metrology and Measurement Systems > 2019 > Vol. 26, nr 1 > 13--21
IEEE Electron Device Letters > 2016 > 37 > 12 > 1625 - 1627
International Journal of Circuit Theory and Applications > 43 > 10 > 1455 - 1473
IEEE Sensors Journal > 2015 > 15 > 7 > 3819 - 3826
IEEE Electron Device Letters > 2015 > 36 > 4 > 390 - 392
Solid State Electronics > 2014 > 95 > Complete > 1-7
IEEE Electron Device Letters > 2014 > 35 > 9 > 942 - 944
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 702 - 706
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 5 > 1145 - 1153
IEEE Electron Device Letters > 2013 > 34 > 3 > 408 - 410
IEEE Electron Device Letters > 2011 > 32 > 7 > 853 - 855
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2347 - 2353
Microelectronic Engineering > 2011 > 88 > 1 > 76-81
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1743 - 1750
IEEE Transactions on Electron Devices > 2007 > 54 > 1 > 78 - 82
IEEE Transactions on Instrumentation and Measurement > 2006 > 55 > 4 > 1143 - 1147
IEEE Transactions on Instrumentation and Measurement > 2006 > 55 > 6 > 2275 - 2280