Search results for: Vemal Raja Manikam
Microelectronics Reliability > 2013 > 53 > 3 > 473-480
Journal of Materials Science: Materials in Electronics > 2013 > 24 > 8 > 2678-2688
Journal of Materials Science: Materials in Electronics > 2013 > 24 > 2 > 720-733
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2012 > 2 > 12 > 1940 - 1948
Materials Science & Engineering B > 2011 > 176 > 3 > 187-203