Search results for: Mustafa Berke Yelten
Analog Integrated Circuits and Signal Processing > 2018 > 97 > 1 > 39-47
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 177 - 179
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 458 - 465
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 466 - 473