Search results for: A. Bravaix
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) > 6A.1-1 - 6A.1-10
Microelectronic Engineering > 2007 > 84 > 9-10 > 1938-1942
Microelectronic Engineering > 2007 > 84 > 9-10 > 1921-1924
Microelectronics Reliability > 2007 > 47 > 9-11 > 1634-1638
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 558 - 570
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 130 - 137
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 225 - 235
Microelectronics Reliability > 2006 > 46 > 9-11 > 1464-1471