Search results for: Kuo-Pin Chang
2015 IEEE International Electron Devices Meeting (IEDM) > 3.2.1 - 3.2.4
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 136 - 141
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2064 - 2070
2013 5th IEEE International Memory Workshop > 143 - 146
2012 International Electron Devices Meeting > 10.1.1 - 10.1.4
2012 International Electron Devices Meeting > 2.3.1 - 2.3.4
Taiwan Journal of Ophthalmology > 2012 > 2 > 4 > 144-147
2010 International Electron Devices Meeting > 5.5.1 - 5.5.4
2010 International Electron Devices Meeting > 5.6.1 - 5.6.4
Journal of AAPOS > 2010 > 14 > 6 > 550-552