Search results for: H Kim
IEEE Journal of Solid-State Circuits > 2017 > 52 > 6 > 1655 - 1663
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-7.1 - SE-7.4
IEEE Electron Device Letters > 2017 > 38 > 3 > 314 - 317
2015 IEEE International Electron Devices Meeting (IEDM) > 20.7.1 - 20.7.4
2015 IEEE International Reliability Physics Symposium > 6A.3.1 - 6A.3.5
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3737 - 3743
COMMAD 2012 > 121 - 122
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 584 - 593