Search results for: Ming-Dou Ker
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2449 - 2454
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 531 - 536
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 242 - 249
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 493 - 498
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1011 - 1018
2011 International Reliability Physics Symposium > EL.2.1 - EL.2.2
IEEE Journal of Solid-State Circuits > 2010 > 45 > 11 > 2476 - 2486
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 238 - 246