Search results for: F Medjdoub
Microelectronics Reliability > 2017 > 76-77 > C > 575-578
IEEE Microwave and Wireless Components Letters > 2017 > 27 > 4 > 419 - 421
Solid-State Electronics > 2016 > 115 > PA > 12-16
2015 IEEE International Electron Devices Meeting (IEDM) > 9.2.1 - 9.2.4
Solid State Electronics > 2015 > 113 > Complete > 49-53
Electronics Letters > 2015 > 51 > 19 > 1532 - 1534
Microelectronics Reliability > 2014 > 54 > 1 > 1-12
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.3.1 - 3C.3.6
IEEE Electron Device Letters > 2012 > 33 > 8 > 1168 - 1170
IEEE Electron Device Letters > 2012 > 33 > 9 > 1258 - 1260
Journal of Crystal Growth > 2011 > 315 > 1 > 204-207
IEEE Electron Device Letters > 2011 > 32 > 7 > 874 - 876
2010 International Electron Devices Meeting > 20.3.1 - 20.3.4